Surface roughness (Ra, Rq)
Quantify height variations across the scanned surface.
Useful forCoatings, polished and deposited surfacesMicroscopy & Imaging
AFM
Atomic Force Microscopy
AFM maps a surface in 3D by scanning a sharp tip across it. It measures height with sub-nanometre precision and works on insulating samples without any coating.
5 test optionsSub-nm height resolutionScan area up to ~90 µmTypical turnaround 5–7 working days
AFM measurement principleIllustrative
01 / Overview
What is AFM?
Atomic Force Microscopy scans a tip with a radius of a few nanometres over the sample. Forces between the tip and the surface bend the cantilever, and a laser tracks that bend to build a 3D map of the surface.
Unlike electron microscopy, AFM needs no vacuum or conductive coating, so polymers, biological films and insulating materials can be measured as they are.
02 / How it works
How it works
- 01
Tip meets surface
A sharp tip on a flexible cantilever approaches the sample.
- 02
Cantilever bends
Surface forces deflect the cantilever as the tip scans line by line.
- 03
Laser reads the bend
A laser reflected off the cantilever lands on a detector that records the deflection.
- 04
Image is built
A feedback loop keeps the force constant and converts the height at each point into a 3D map.
03 / What it measures
What it measures
Step height & film thickness
Measure the height difference across a surface step.
Useful forThin films, lithography patternsParticle size & height
Resolve individual particles supported on a surface.
Useful forNanoparticles on a substratePhase contrast
Compare local differences in tip–sample interaction.
Useful forMixed materials, polymer blendsMagnetic domains
Map magnetic interactions with a magnetised tip.
Useful forMagnetic films and media (MFM)Local conductivity
Map current flow as a conductive tip scans the sample.
Useful forConductive films, devices (CFM)04 / Test options
Choose the AFM options you need
5 options · none added yet
05 / Sample requirements
Sample requirements
- Accepted forms
- Films on substrate, flat solids, powders dispersed on mica or silicon
- Size
- Up to 10 × 10 mm, thickness under 5 mm
- Surface height variation
- Under ~5 µm across the scan area
- Quantity
- One piece per sample; 50 mg for powders
- Clean, dry and dust-free surface
- Sample fixed flat, no loose particles
- Label the side to be measured
- No liquids or sticky residues
- No very rough or porous surfaces without discussing first
Hazardous or air-sensitive samples: mention it in your request and attach the MSDS.
06 / Results & turnaround
Results & turnaround
What you receive
- High-resolution 2D and 3D images
- Roughness parameters (Ra, Rq, Rmax)
- Line profiles on request
- Raw data files
- Report PDF
Turnaround & pricing
Typically 5–7 working days after samples reach the lab.
Price confirmed in your quotation, depending on user type, options and number of samples.
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