Nanoscience
Atomic Force Microscopy (AFM) Testing
AFM maps surface topography at micro- to nanoscale and can quantify roughness, height, feature dimensions, and selected material interactions.
Atomic Force Microscopy scans a sharp probe over a surface and reconstructs topography from probe-sample interaction. It is useful when three-dimensional height information or nanoscale roughness matters. RNDgrid helps define scan size, mode, number of areas, substrate, and expected roughness so the laboratory can select a suitable tip and feedback conditions.
When this method is useful
- Thin films, coatings, polished solids, membranes, nanostructures, electronic materials, and deposited particles
- Surface roughness, step height, feature dimensions, grain morphology, and nanoscale comparison
- Samples where optical or electron microscopy does not provide reliable height information
What the report can include
- Two-dimensional and three-dimensional topography images
- Height profiles and roughness parameters over stated scan areas
- Optional phase or force-related channels when the instrument, sample, and scope support them
Sample preparation and scoping
- Samples should be clean, firmly mounted, reasonably flat, and sized for the instrument stage.
- Loose powders usually require stable deposition on a suitable substrate.
- Specify representative scan areas and expected feature scale to avoid an uninformative scan size.
Limitations to consider
- The tip shape can broaden narrow features and affect lateral dimensions.
- A small scan area may not represent a heterogeneous bulk sample.
- Soft, mobile, rough, or contaminated surfaces can be difficult to measure reproducibly.
Capabilities, detection limits, accreditation scope, and turnaround vary by method and partner laboratory. Confirm the final scope in the quotation before sending samples.
Questions to answer before booking
- Do you need roughness, step height, particle dimensions, phase contrast, or force information?
- What scan size and expected vertical range are relevant?
- Can the sample be mounted flat and remain stable during scanning?
Related methods
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