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Analytical Testing & Material Characterization

Select a technique based on what you need to measure-not only the instrument name. These guides explain capabilities, sample preparation, outputs, and limitations before you submit a request.

Testing guides

Microscopy

Scanning Electron Microscopy (SEM) Testing

SEM testing produces high-resolution surface images for studying morphology, particle shape, fractures, coatings, and microstructural features in solid samples.

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Crystallography

X-ray Diffraction (XRD) Testing

XRD testing helps identify crystalline phases and evaluate crystal structure, preferred orientation, crystallinity, and related material properties.

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Spectroscopy

FTIR Spectroscopy Analysis

FTIR analysis measures infrared absorption to investigate functional groups, chemical bonding, material identity, and changes between samples.

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Surface analysis

BET Surface Area and Porosity Analysis

BET gas adsorption analysis evaluates specific surface area and can support pore-volume and pore-size characterization of porous solids.

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Nanoscience

Atomic Force Microscopy (AFM) Testing

AFM maps surface topography at micro- to nanoscale and can quantify roughness, height, feature dimensions, and selected material interactions.

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Thermal analysis

Differential Scanning Calorimetry (DSC) Analysis

DSC measures heat-flow changes associated with melting, crystallization, glass transition, curing, and other thermal events.

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Thermal analysis

Thermogravimetric Analysis (TGA)

TGA measures mass change during controlled heating to assess moisture, volatiles, decomposition, oxidation, residue, and thermal stability.

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Elemental analysis

Energy Dispersive X-ray (EDX/EDS) Analysis

EDX analysis provides localized elemental screening and mapping, commonly alongside SEM imaging.

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Elemental analysis

ICP-MS Trace Element Analysis

ICP-MS measures many elements at trace and ultra-trace concentration after suitable sample preparation and digestion.

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Spectroscopy

Nuclear Magnetic Resonance (NMR) Spectroscopy

NMR spectroscopy provides structural and chemical-environment information for molecules in suitable solution or solid-state experiments.

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Particle characterization

Particle Size Analysis (DLS and Laser Diffraction)

Particle-size analysis measures a distribution, but the correct technique depends on whether the sample is a nanoscale dispersion, micron-scale powder, suspension, or emulsion.

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Surface analysis

X-ray Photoelectron Spectroscopy (XPS) Analysis

XPS measures elemental composition and chemical-state information from the outermost few nanometres of a material surface.

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Not sure which method fits?

Share the sample type, expected composition, feature or concentration range, and the decision you need to make. RNDgrid will help scope suitable testing with its partner-lab network.

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