Microscopy
Scanning Electron Microscopy (SEM) Testing
SEM testing produces high-resolution surface images for studying morphology, particle shape, fractures, coatings, and microstructural features in solid samples.
View method guideSelect a technique based on what you need to measure-not only the instrument name. These guides explain capabilities, sample preparation, outputs, and limitations before you submit a request.
Microscopy
SEM testing produces high-resolution surface images for studying morphology, particle shape, fractures, coatings, and microstructural features in solid samples.
View method guideCrystallography
XRD testing helps identify crystalline phases and evaluate crystal structure, preferred orientation, crystallinity, and related material properties.
View method guideSpectroscopy
FTIR analysis measures infrared absorption to investigate functional groups, chemical bonding, material identity, and changes between samples.
View method guideSurface analysis
BET gas adsorption analysis evaluates specific surface area and can support pore-volume and pore-size characterization of porous solids.
View method guideNanoscience
AFM maps surface topography at micro- to nanoscale and can quantify roughness, height, feature dimensions, and selected material interactions.
View method guideThermal analysis
DSC measures heat-flow changes associated with melting, crystallization, glass transition, curing, and other thermal events.
View method guideThermal analysis
TGA measures mass change during controlled heating to assess moisture, volatiles, decomposition, oxidation, residue, and thermal stability.
View method guideElemental analysis
EDX analysis provides localized elemental screening and mapping, commonly alongside SEM imaging.
View method guideElemental analysis
ICP-MS measures many elements at trace and ultra-trace concentration after suitable sample preparation and digestion.
View method guideSpectroscopy
NMR spectroscopy provides structural and chemical-environment information for molecules in suitable solution or solid-state experiments.
View method guideParticle characterization
Particle-size analysis measures a distribution, but the correct technique depends on whether the sample is a nanoscale dispersion, micron-scale powder, suspension, or emulsion.
View method guideSurface analysis
XPS measures elemental composition and chemical-state information from the outermost few nanometres of a material surface.
View method guideShare the sample type, expected composition, feature or concentration range, and the decision you need to make. RNDgrid will help scope suitable testing with its partner-lab network.
Share Request