Elemental analysis
Energy Dispersive X-ray (EDX/EDS) Analysis
EDX analysis provides localized elemental screening and mapping, commonly alongside SEM imaging.
Energy Dispersive X-ray Spectroscopy detects characteristic X-rays generated when an electron beam interacts with a specimen. It is valuable for locating elements in features visible by SEM. RNDgrid helps define point spectra, areas, line scans, maps, and expected elements so that acquisition conditions and coating choices support the objective.
When this method is useful
- Metals, ceramics, minerals, catalysts, particles, coatings, inclusions, residues, and fracture surfaces
- Qualitative elemental screening, feature comparison, contamination checks, and spatial distribution maps
- SEM investigations that need chemistry linked to visible microstructural features
What the report can include
- Point or area spectra with detected-element labels
- Semi-quantitative composition under stated assumptions when requested
- Element maps or line profiles over selected fields when included in scope
Sample preparation and scoping
- Supply dry, vacuum-compatible material and describe expected elements and substrate.
- Carbon coating is often preferred when low-level elemental interpretation would be affected by metal coating.
- Identify the number of locations, maps, phases, or particles required.
Limitations to consider
- Light-element sensitivity, detection limits, peak overlap, matrix effects, geometry, and coating affect results.
- EDX samples a finite interaction volume and may mix signals from thin features and substrate.
- Routine standardless numbers are semi-quantitative and should not be treated as certified bulk composition.
Capabilities, detection limits, accreditation scope, and turnaround vary by method and partner laboratory. Confirm the final scope in the quotation before sending samples.
Questions to answer before booking
- Do you need presence/absence, semi-quantification, point comparison, or mapping?
- Could the substrate or coating interfere with elements of interest?
- Is bulk trace analysis better served by ICP-MS, ICP-OES, or another technique?
Related methods
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