Surface analysis
X-ray Photoelectron Spectroscopy (XPS) Analysis
XPS measures elemental composition and chemical-state information from the outermost few nanometres of a material surface.
X-ray Photoelectron Spectroscopy irradiates a surface with X-rays and measures emitted electron energies. It is suited to coatings, oxidation, contamination, catalysts, electronic materials, and surface treatments. RNDgrid coordinates survey scans, high-resolution regions, charge correction, sputter depth profiling, sample handling, and expected chemistry.
When this method is useful
- Thin films, oxides, catalysts, metals, polymers, batteries, semiconductors, coatings, and treated surfaces
- Surface elemental composition, oxidation state, bonding environment, contamination, and depth profiles
- Comparing modified, aged, cleaned, coated, or reacted surfaces
What the report can include
- Survey spectrum and surface atomic percentages under stated assumptions
- High-resolution spectra for selected elements and chemical-state fitting when scoped
- Optional sputter depth profile with clearly stated sputter conditions and limitations
Sample preparation and scoping
- Protect the surface from handling, packaging residue, air exposure, and cleaning unless these are part of the study.
- Provide expected elements, oxidation states, substrate, coating thickness, and air sensitivity.
- Agree whether charge-neutralization, transfer protection, angle-resolved work, or sputtering is required.
Limitations to consider
- XPS is surface-sensitive and may not represent bulk composition.
- Peak fitting requires justified constraints and reference data; over-fitting can create unsupported chemical assignments.
- Sputter profiling can alter chemistry, preferentially remove elements, and produces model-dependent depth estimates.
Capabilities, detection limits, accreditation scope, and turnaround vary by method and partner laboratory. Confirm the final scope in the quotation before sending samples.
Questions to answer before booking
- Is the question surface composition, chemical state, contamination, coating, or depth profile?
- How air-sensitive or charging-prone is the sample?
- Which high-resolution regions and expected bonding states need evaluation?
Related methods
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