Thin-film phase identification
Identify crystalline phases in films and coatings.
Useful forOxide, nitride and perovskite filmsStructure & Diffraction
GI-XRD
Grazing Incidence X-ray Diffraction
GI-XRD measures the crystal structure of thin films and surface layers by sending X-rays in at a very shallow angle. The signal stays in the film instead of being swamped by the substrate.
2 test optionsPhases in thin films & coatingsIncidence angle ~0.2–2°Typical turnaround 4–6 working days
GI-XRD measurement principleIllustrative
01 / Overview
What is GI-XRD?
In Grazing Incidence X-ray Diffraction the X-ray beam meets the sample at a small fixed angle, typically 0.2–2°, while only the detector scans through 2θ. At such low angles the beam runs a long path through the top layer and penetrates only a shallow depth.
In a standard XRD scan a thin film gives weak peaks that are often hidden by the substrate. GI-XRD boosts the film signal and, by repeating the scan at different incidence angles, can compare phases near the surface with those deeper in the layer.
02 / How it works
How it works
- 01
Film is mounted flat
The coated substrate is fixed flat on the stage and aligned to the beam height.
- 02
Beam grazes the surface
X-rays arrive at a small fixed angle and spread over the film, staying close to the surface.
- 03
Detector scans 2θ
Only the detector moves, collecting X-rays diffracted by crystals in the film.
- 04
Film phases identified
Peaks are matched to reference patterns; repeating at other angles shows changes with depth.
03 / What it measures
What it measures
Phases with depth
Compare surface and deeper layers by changing the incidence angle.
Useful forGraded, oxidised or treated surfacesFilm crystallinity
See whether a coating is amorphous, partly or fully crystalline.
Useful forAnnealing studies, deposited layersCrystallite size in films
Estimate grain size in the layer from peak broadening.
Useful forNanocrystalline and sputtered filmsSurface layers on parts
Detect thin oxide, corrosion or treated layers on flat solid parts.
Useful forCorrosion, oxidation, surface treatment04 / Test options
Choose the GI-XRD options you need
2 options · none added yet
05 / Sample requirements
Sample requirements
- Accepted forms
- Thin films and coatings on flat, rigid substrates
- Size
- About 10 × 10 mm to 20 × 20 mm, under 5 mm thick
- Film thickness
- Typically ~10 nm to a few µm
- Flatness
- Flat, not curved or bowed; polished substrates work best
- Clean, dust-free film surface
- Label the coated side and the film material
- Mention film thickness and substrate if known
- No fingerprints or scratches on the coated face
- No loose powders — use standard XRD instead
Hazardous or air-sensitive samples: mention it in your request, and attach the MSDS if you have one.
06 / Results & turnaround
Results & turnaround
What you receive
- GI-XRD diffractogram (intensity vs 2θ)
- Incidence angle and scan conditions
- Phase identification (with ICDD fitting)
- Raw data files
- Report PDF
Turnaround & pricing
Typically 4–6 working days after samples reach the lab.
Price confirmed in your quotation, depending on user type, options and number of samples.
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