Phase identification
Identify crystalline compounds from their peak positions.
Useful forMinerals, catalysts, ceramics, drugsStructure & Diffraction
XRD
X-ray Diffraction
XRD identifies the crystalline phases in a material from the angles at which it diffracts X-rays. It is the standard test for phase identification, crystallinity and crystallite size.
5 test optionsPhase identification & purity2θ range typically 5–90°Typical turnaround 3–5 working days
XRD measurement principleIllustrative
01 / Overview
What is XRD?
X-ray Diffraction directs a monochromatic X-ray beam, usually Cu Kα, at the sample while a detector moves through a range of angles. Crystal planes diffract the beam only at angles that satisfy Bragg's law, so each crystalline phase gives its own pattern of peaks.
Because the pattern is a fingerprint of the crystal structure, XRD tells apart phases and polymorphs of the same composition, which elemental methods cannot. It is non-destructive, needs little preparation, and one scan also gives crystallite size, strain and lattice parameters.
02 / How it works
How it works
- 01
Sample is prepared
Powder is ground fine and pressed flat into a holder, level with its rim.
- 02
X-rays strike the sample
A monochromatic X-ray beam meets the sample surface at a set angle θ.
- 03
Planes diffract the beam
Where Bragg's law is met, crystal planes reflect X-rays in phase and a peak appears.
- 04
Pattern is matched
Peak positions and intensities are compared with reference patterns to identify phases.
03 / What it measures
What it measures
Crystallinity
Compare sharp crystalline peaks with broad amorphous humps.
Useful forPolymers, glasses, pharmaceuticalsCrystallite size & strain
Estimate size from peak broadening (Scherrer or Williamson–Hall).
Useful forNanoparticles, nanocrystalline powdersLattice parameters
Refine unit-cell dimensions from accurate peak positions.
Useful forDoped materials, solid solutionsPhase quantification
Estimate the proportion of each phase, for example by Rietveld refinement.
Useful forMixtures, cements, battery materialsPolymorph screening
Distinguish different crystal forms of the same compound.
Useful forAPIs and fine chemicals04 / Test options
Choose the XRD options you need
5 options · none added yet
05 / Sample requirements
Sample requirements
- Accepted forms
- Dry powders, pellets, bulk solids, films on flat substrates
- Powder quantity
- About 0.5–1 g; smaller amounts possible on a low-background holder
- Solid size
- Flat piece up to about 20 × 20 mm, under 5 mm thick
- Particle size
- Finely ground powder gives the best data (roughly under 45 µm)
- Dry, finely ground powder
- Flat, clean surface on solid pieces and films
- Mention expected phases or composition if known
- No liquids, gels or wet pastes
- No toxic or reactive powders without discussing first
Hazardous or air-sensitive samples: mention it in your request, and attach the MSDS if you have one.
06 / Results & turnaround
Results & turnaround
What you receive
- Diffractogram (intensity vs 2θ)
- Peak list with d-spacings
- Phase identification (with ICDD fitting)
- Refined parameters (with Rietveld options)
- Raw data files
- Report PDF
Turnaround & pricing
Typically 3–5 working days after samples reach the lab.
Price confirmed in your quotation, depending on user type, options and number of samples.
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