Elements present
Identify which elements are in a spot, area or particle.
Useful forUnknown residues, contaminants, mineralsElemental & Composition
EDX / EDS
Energy Dispersive Spectroscopy
EDX identifies the elements in a sample from the characteristic X-rays it emits under an electron beam. It gives fast, semi-quantitative composition of a spot, area or map, usually alongside SEM imaging.
1 test optionDetects elements from ~B to UDetection limit ~0.1–1 wt%Typical turnaround 4–6 working days
EDX / EDS measurement principleIllustrative
01 / Overview
What is EDX / EDS?
When the electron beam of an SEM or TEM strikes a sample, it knocks inner-shell electrons out of atoms. As outer electrons drop into the gaps, each element emits X-rays at its own characteristic energies, and an energy-dispersive detector sorts them into a spectrum of peaks.
EDX analyses a feature you can see in the image, and can map how elements are spread across it, which bulk methods such as XRF or ICP cannot. Results are semi-quantitative, detection limits are typically 0.1–1 wt%, and H, He and Li cannot be detected.
02 / How it works
How it works
- 01
Sample goes into the SEM
The sample is mounted on a stub under the beam; insulators get a thin carbon coat.
- 02
Beam excites atoms
The focused electron beam knocks inner-shell electrons out of atoms in a small volume.
- 03
X-rays are sorted
Each element emits X-rays at its own energies; the detector counts them by energy.
- 04
Spectrum and maps
Peaks are identified and quantified, or the beam is scanned to map each element.
03 / What it measures
What it measures
Semi-quantitative composition
Estimate the wt% and at% of the detected elements.
Useful forAlloys, ceramics, catalysts, coatingsPoint & area analysis
Target a single particle, inclusion or region you can see in the image.
Useful forInclusions, defects, individual particlesLine scans
Follow how composition changes across an interface or coating.
Useful forCoatings, diffusion zones, jointsElemental maps
Show where each element sits across the imaged area.
Useful forSegregation, dopants, coating coverage04 / Test options
Choose the EDX / EDS options you need
1 option · none added yet
05 / Sample requirements
Sample requirements
- Accepted forms
- Powders, films, fibres, solid pieces, polished sections
- Size
- Up to ~20 × 20 mm, height under 10 mm
- Quantity
- About 10 mg of powder; one piece per sample
- Surface
- Flat, polished surfaces give the most reliable numbers
- Condition
- Dry, vacuum-stable, free of solvents and oils
- Fully dry samples, free of solvents and moisture
- Powders in sealed, labelled vials
- Mark the spot or region you want analysed
- List the elements you expect or need checked
- No liquids, gels or wet samples
- No samples that outgas or decompose in vacuum
Hazardous or air-sensitive samples: mention it in your request, and attach the MSDS if you have one.
06 / Results & turnaround
Results & turnaround
What you receive
- EDX spectra with identified element peaks
- Semi-quantitative wt% and at% tables
- Image showing where each analysis was taken
- Raw spectrum files
- Report PDF
Turnaround & pricing
Typically 4–6 working days after samples reach the lab.
Price confirmed in your quotation, depending on user type, options and number of samples.
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