Surface morphology
See shape, texture and topography of the surface at high magnification.
Useful forPowders, fibres, fractures, coatingsMicroscopy & Imaging
SEM
Scanning Electron Microscopy
SEM images a surface by scanning it with a focused electron beam. It shows morphology, particle size and texture from millimetres down to tens of nanometres, and with EDX it adds elemental composition.
6 test optionsResolution ~3–5 nm at 30 kVOptional EDX elemental analysisTypical turnaround 4–6 working days
SEM measurement principleIllustrative
01 / Overview
What is SEM?
Scanning Electron Microscopy focuses a beam of electrons to a fine spot and scans it across the sample in a vacuum. Each point gives off secondary and backscattered electrons, and a detector counts them to build a greyscale image of the surface.
SEM offers far higher magnification and depth of field than an optical microscope, so rough surfaces, powders and fractures stay in focus. Adding EDX identifies the elements in any feature you can see; insulating samples are usually gold coated first.
02 / How it works
How it works
- 01
Sample is mounted
The sample is fixed to a metal stub with conductive tape; insulating samples get a thin gold coat.
- 02
Beam is focused
In high vacuum, magnetic lenses focus electrons from the gun into a fine spot on the surface.
- 03
Beam scans the surface
Scan coils sweep the spot line by line; each point gives off secondary and backscattered electrons.
- 04
Image is formed
A detector counts the electrons from each point, building a greyscale micrograph pixel by pixel.
03 / What it measures
What it measures
Particle size & shape
Measure individual particles and agglomerates directly from the micrographs.
Useful forPowders, catalysts, microspheresElemental composition (EDX)
Identify the elements in a spot or area and their approximate amounts.
Useful forAlloys, minerals, contaminantsElemental distribution maps
Show where each element sits across the imaged area.
Useful forSegregation, dopants, coating coverageLayer & coating thickness
Measure layers and interfaces on a cross-section.
Useful forFilms, coatings, multilayersPorosity & defects
Spot pores, cracks and inclusions in the surface or a section.
Useful forCeramics, membranes, failure analysis04 / Test options
Choose the SEM options you need
6 options · none added yet
05 / Sample requirements
Sample requirements
- Accepted forms
- Powders, films, fibres, solid pieces, fracture surfaces
- Size
- Up to ~20 × 20 mm, height under 10 mm
- Quantity
- About 10 mg of powder; one piece per sample
- Condition
- Dry, vacuum-stable, free of solvents and oils
- Fully dry samples, free of solvents and moisture
- Powders in sealed, labelled vials
- Mark the face or region to be imaged
- Mention if the sample is non-conductive
- No liquids, gels or wet biological samples
- No samples that outgas, melt or decompose in vacuum
Hazardous or air-sensitive samples: mention it in your request, and attach the MSDS if you have one.
06 / Results & turnaround
Results & turnaround
What you receive
- Micrographs at several magnifications, with scale bars
- EDX spectra and composition tables (if selected)
- Elemental maps (if selected)
- Raw image files
- Report PDF
Turnaround & pricing
Typically 4–6 working days after samples reach the lab.
Price confirmed in your quotation, depending on user type, options and number of samples.
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