Nanoscale morphology
See the fine surface structure of nanomaterials at high magnification.
Useful forNanoparticles, nanorods, porous filmsMicroscopy & Imaging
FESEM
Field Emission Scanning Electron Microscopy
FESEM images surfaces with a field-emission electron source that gives a much finer, brighter beam than a conventional SEM. It resolves nanoscale features, even at low voltage, and adds elemental analysis with EDX.
6 test optionsResolution around 1–2 nmLow-kV imaging of delicate samplesTypical turnaround 5–7 working days
FESEM measurement principleIllustrative
01 / Overview
What is FESEM?
Field Emission SEM draws electrons from a very sharp tip with a strong electric field instead of heating a filament. The source is small and bright, so the beam can be focused to a spot around a nanometre across as it scans the sample in high vacuum.
Compared with a conventional SEM, FESEM gives sharper images at high magnification and works well at low accelerating voltage, which reduces charging and beam damage. It suits nanoparticles, nanofibres and thin films; EDX adds elemental analysis.
02 / How it works
How it works
- 01
Field extracts electrons
A strong electric field pulls electrons from an ultra-sharp tip, giving a small, bright source.
- 02
Beam is focused finely
Magnetic lenses focus the beam to a spot around a nanometre across.
- 03
Spot scans the surface
The spot is swept across the sample line by line, often at low voltage to limit charging.
- 04
Detectors build the image
In-lens and other detectors collect electrons point by point to form a high-resolution micrograph.
03 / What it measures
What it measures
Particle & grain size
Measure nanoparticles and grains directly from the micrographs.
Useful forCatalysts, nanopowders, thin filmsFilm & layer thickness
Measure thin films, layers and interfaces on a cross-section.
Useful forThin films, coatings, device stacksElemental composition (EDX)
Identify the elements in a spot or area and their approximate amounts.
Useful forComposites, doped materials, residuesElemental maps
Show how each element is distributed across the image.
Useful forHeterostructures, dopants, segregationPore & fibre structure
Examine pore openings, fibre diameters and network structure.
Useful forMembranes, electrospun mats, foams04 / Test options
Choose the FESEM options you need
6 options · none added yet
05 / Sample requirements
Sample requirements
- Accepted forms
- Powders, films on substrate, fibres, small solid pieces
- Size
- Up to ~10 × 10 mm, height under 5 mm
- Quantity
- About 5–10 mg of powder; one piece per sample
- Condition
- Dry, vacuum-stable, free of solvents and oils
- Fully dry samples, free of solvents and moisture
- Nanopowders in sealed, labelled vials
- Mark the face or region to be imaged
- Mention if the sample is non-conductive or beam-sensitive
- No liquids, pastes or wet biological samples
- No oily, greasy or outgassing samples
Hazardous or air-sensitive samples: mention it in your request, and attach the MSDS if you have one.
06 / Results & turnaround
Results & turnaround
What you receive
- High-resolution micrographs with scale bars
- EDX spectra and composition tables (if selected)
- Elemental maps (if selected)
- Raw image files
- Report PDF
Turnaround & pricing
Typically 5–7 working days after samples reach the lab.
Price confirmed in your quotation, depending on user type, options and number of samples.
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