Lattice fringes & d-spacing
Measure the spacing between atomic planes to help identify phases.
Useful forNanocrystals, catalysts, 2D materialsMicroscopy & Imaging
HRTEM
High Resolution Transmission Electron Microscopy
HRTEM images the atomic lattice of crystalline materials by passing electrons through a very thin sample. It reveals lattice fringes, d-spacings, defects and interfaces in nanoparticles, with diffraction and EDS from the same area.
6 test optionsPoint resolution ~0.2 nmLattice fringes, SAED and EDSTypical turnaround 8–12 working days
HRTEM measurement principleIllustrative
01 / Overview
What is HRTEM?
High Resolution TEM passes a parallel, high-energy electron beam, typically at 200 kV, through a sample only a few tens of nanometres thick. Electron waves scattered by rows of atoms interfere with the direct beam, so the image shows the crystal lattice itself as regular fringes.
Where conventional TEM shows particle size and shape, HRTEM shows how the atoms are arranged inside them: lattice spacings, twins, dislocations and interfaces. SAED confirms the crystal structure and EDS the elements, all from the same particle.
02 / How it works
How it works
- 01
Grid is prepared
A dilute dispersion is dropped onto a thin carbon film on a copper grid and dried.
- 02
Crystal is aligned
A thin particle is found and tilted so its rows of atoms line up with the beam.
- 03
Waves interfere
Electron waves scattered by the lattice interfere with the direct beam to form fringes.
- 04
Fringes are measured
The camera records the image; fringe spacings and FFT or SAED patterns give d-spacings.
03 / What it measures
What it measures
Crystal structure (SAED)
Diffraction spots or rings show single, poly or non-crystalline regions.
Useful forPhase and crystallinity checksDefects & interfaces
See twins, stacking faults, dislocations and grain boundaries.
Useful forAlloys, heterostructures, thin filmsParticle size & shape
Measure nanoparticles and shell thickness at high magnification.
Useful forQuantum dots, core–shell particlesElemental composition (EDS)
Identify the elements in a particle or region and their approximate amounts.
Useful forDoped, alloyed and mixed nanoparticlesElemental maps
Show where each element sits within particles and across interfaces.
Useful forCore–shell, segregation, dopant studies04 / Test options
Choose the HRTEM options you need
6 options · none added yet
05 / Sample requirements
Sample requirements
- Accepted forms
- Nanopowders, colloidal dispersions, 2D flakes, ready-made grids
- Quantity
- About 5–10 mg of powder or 1 mL of dispersion
- Thickness
- Ideally under ~50 nm; bulk solids must be thinned first
- Magnetic samples
- Declare them and choose the magnetic sample option
- Condition
- Dry, vacuum-stable, as free of surfactant residue as possible
- Dry powders in sealed, labelled vials
- Name a solvent the sample disperses in
- Declare magnetic or beam-sensitive samples
- Mention the expected phase or lattice if known
- No bulk pieces unless already thinned for TEM
- No samples that outgas or decompose in vacuum
Hazardous or air-sensitive samples: mention it in your request, and attach the MSDS if you have one.
06 / Results & turnaround
Results & turnaround
What you receive
- Lattice-resolution and overview micrographs, with scale bars
- d-spacing measurements on request
- SAED patterns (if selected)
- EDS spectra and elemental maps (if selected)
- Raw image files
- Report PDF
Turnaround & pricing
Typically 8–12 working days after samples reach the lab.
Price confirmed in your quotation, depending on user type, options and number of samples.
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